Optical Properties of Copper-Zinc Sulphide Network from Mixed Single Solid Source Precursors of Copper and Zinc Dithiocarbamates

Joseph Onyeka  EMEGHA; Chukwudi Mcdonald  OKAFOR; Kingsley Eghonghon  UKHUREBOR

doi:10.48048/wjst.2021.9535

Authors

Joseph Onyeka EMEGHA Department of Physics, University of Benin, Benin City, Edo State, Nigeria
Chukwudi Mcdonald OKAFOR Department of Physics Education, Federal College of Education (Technical) Asaba, Delta State, Nigeria
Kingsley Eghonghon UKHUREBOR Department of Physics, Edo State University Uzairue, Edo State, Nigeria

DOI:

https://doi.org/10.48048/wjst.2021.9535

Keywords:

Dithiocarbamate, Precursors, Metal-organic chemical vapour deposition (MOCVD), Thin films, Fourier transforms infrared (FTIR), Spectrophotometer, Copper, Zinc

Abstract

Thin films of copper-zinc sulphide (CxZn1-xS) have been deposited by metal-organic chemical vapour deposition (MOCVD) technique at 400 °C on soda-lime substrates. The films contained copper dithiocarbamate and zinc dithiocarbamate of various concentrations. The effect of the precursor’s concentration was investigated using Fourier transforms infrared (FTIR) spectroscopy and UV-Vis Spectrophotometer. The precursors’ FTIR spectrums have the characteristics of copper sulphide and zinc sulphide absorption bands below 800 cm^-1. The optical properties for all the samples were studied by reading the absorbance and transmittance spectra in the range of 300 - 900 nm. The results indicate direct bandgap energy that ranged between 2.20 to 3.42 eV. The films were found to have a very high transmittance in the visible and near-infrared regions and an average reflectance of about 0.14 in the same regions. Optical constants like refractive index, extinction coefficient, and optical conductivity were estimated as a function of photon energy. The various properties exhibited by the films indicate that the films can find application in various optoelectronic devices.

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